%0 GKSS report
%@ 0584-8547
%A Knoth, J., Bormann, R., Gutschke, R., Michaelsen, C., Schwenke, H.

%D 1993
%J Spectrochimica Acta  B
%N 2
%P 285-292 

%T Examination of layered structures by total reflection X-ray fluorescence analysis
%U 
2 
%X