%0 journal article
%@ 0584-8547
%A Schwenke, H., Knoth, J., Guenther, R., Wiener, G., Bormann, R.

%D 1997
%J Spectrochimica Acta  B

%P 795-803 

%T Depth profiling using total reflection X-ray fluorescence spectrometry alone and in combination with ion beam sputtering
%U 
 
%X