@misc{wiener_concentrationdepth_profiling_1995, 
author={Wiener, G., Michaelsen, C., Knoth, J., Schwenke, H., Bormann, R.},
title={Concentration-depth profiling using toal-reflection X-ray fluorescence spectrometry in combination with ion-beam microsectioning techiques},
year={1995},
howpublished = {journal article},
note = {Wiener, G.; Michaelsen, C.; Knoth, J.; Schwenke, H.; Bormann, R.: Concentration-depth profiling using toal-reflection X-ray fluorescence spectrometry in combination with ion-beam microsectioning techiques. Review of Scientific Instruments. 1995. vol. 66, no. 1, 20-23.}}