%0 journal article %@ 0034-6748 %A Wiener, G., Michaelsen, C., Knoth, J., Schwenke, H., Bormann, R. %D 1995 %J Review of Scientific Instruments %N 1 %P 20-23 %T Concentration-depth profiling using toal-reflection X-ray fluorescence spectrometry in combination with ion-beam microsectioning techiques %U 1 %X