%0 journal article
%@ 0734-2101
%A Barmak, K., Rickman, J. M., Michaelsen, C., Ristau, R. A., Kim, J., Lucadamo, G., Carpenter, D. T., Tong, W. S.

%D 1999
%J Journal of Vacuum Science and Technology  A

%P 1950-1957 

%T Ex-Situ Characterization of Phase Transformations and Associated Microstructures in Polycrystalline Thin Films
%U 
 
%X