%0 GKSS report
%@ 
%A Schwenke, H., Gutschke, R., Knoth, J.

%D 1992
%J Advances in X-Ray Analysis: Proceedings of combined First Pacific-International Congress on X-Ray Analytical Methods (PICXAM) and Fortieth Annual Conference on Applications of X-Ray Analysis
%N 35
%P 941-946 

%T Characterization of near surface layers by means of total reflection X-ray fluorescence spectrometry
%U 
35 
%X