%0 journal article
%@ 0141-8610
%A Lucadamo, G., Watanabe, M., Barmak, K., Williams, D.B., Michaelsen, C., Alani, R.

%D 1999
%J Philosophical Magazine  A
%N 6
%P 1423-1442 

%T High-resolution quantitative X-ray microanalysis of Nb/Al multilayer thin films using the Zeta-factor approach
%U 
6 
%X