%0 conference poster
%@ 
%A Michaelsen, C., Wiesmann, J., Bormann, R., Hollensteiner, S., Dieker, C., Jaeger, W.

%D 2001
%J Dreilaendertagung fuer Elektronenmikroskopie 2001

 

%T Characterization of structure and interfaces of new multilayer x-ray mirrors
%U 
 
%X