%0 journal article
%@ 0584-8547
%A Schwenke, H., Beaven, P., Knoth, J., Jantzen, E.

%D 2003
%J Spectrochimica Acta  A
%N 12
%P 2039-2048 
%R doi:10.1016/S0584-8547(03)00188-5
%T A Wavelength-dispersive Arrangement for Wafer Analysis with Total Reflection X-ray Fluorescence Spectrometry using Synchrotron Radiation
%U https://doi.org/10.1016/S0584-8547(03)00188-5
12 
%X