%0 conference lecture
%@ 
%A Gabrisch, H., Mayer, S., Pyczak, F., Rackel, M., Lorenz, U., Schell, N., Schreyer, A., Stark, A.

%D 2013
%J Microscopy Conference, MC 2013

 

%T Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging
%U 
 
%X