Depth profiling using total reflection X-ray fluorescence spectrometry alone and in combination with ion beam sputtering
No abstract available.
URL: https://publications.hereon.de/id/13053/
Authors:Schwenke, H., Knoth, J., Guenther, R., Wiener, G., Bormann, R.
Year:1997
In: Spectrochimica Acta B
Volume:52
Pages: 795 - 803
Type:Journalpaper
ISSN: 0584-8547
Cite as: Schwenke, H.; Knoth, J.; Guenther, R.; Wiener, G.; Bormann, R.: Depth profiling using total reflection X-ray fluorescence spectrometry alone and in combination with ion beam sputtering. In: Spectrochimica Acta B. Vol. 52 (1997) 795 - 803.
