Finite element analyses to determine calibration curves for the measurement of the depth of semicircular and ellipsoideal surface cracks by d.c. potential method
No abstract available.
URL: https://publications.hereon.de/id/13765/
Authors:Dietrich, R. A.
Year:1989
In: 7th Conference on Nonlinear Finite Element Analyses and ADINA
Location:Cambridge, MA (USA)
Date:August 2-4, 1989
Cite as: Dietrich, R. A.: Finite element analyses to determine calibration curves for the measurement of the depth of semicircular and ellipsoideal surface cracks by d.c. potential method. In: 7th Conference on Nonlinear Finite Element Analyses and ADINA. Cambridge, MA (USA), August 2-4, 1989, 1989.
