Kinetics of interface reactions in polycrystalline thin films

Confpaper

No abstract available.

URL: https://publications.hereon.de/id/16172/
Authors:Bormann, R.
Year:1994
In: Polycristalline Thin Films: Structure, Texture, Properties and Applications
Location:San Francisco, CA (USA)
Date:04.-08.04.1994
Pages: 169 - 180
Type:Confpaper
Cite as: Bormann, R.: Kinetics of interface reactions in polycrystalline thin films. In: Barmak, K.; Parker, M.A.; Floro, J.A.; Sinclair, R.; Smith, D.A. (Eds.): Polycristalline Thin Films: Structure, Texture, Properties and Applications. San Francisco, CA (USA), 04.-08.04.1994, 1994. 169 - 180.