Characterization of reactive phase formation in sputter-deposited Ni/Al multilayer thin films using transmission electron microscopy

Confpaper

No abstract available.

URL: https://publications.hereon.de/id/16685/
Authors:Lucadamo, G., Barmak, K., Michaelsen, C.
Year:1996
In: Proceedings of Microscopy and Microanalysis 1996
Location:Minneapolis, MN (USA)
Date:August 11-15, 1996
Pages: 1000 - 1001
Type:Confpaper
Cite as: Lucadamo, G.; Barmak, K.; Michaelsen, C.: Characterization of reactive phase formation in sputter-deposited Ni/Al multilayer thin films using transmission electron microscopy. In: Bailey, G.W.; Corbett, J.M.; Dimlich, R.V.W.; Michael, J.R.; Zaluzec, N.J. (Eds.): Proceedings of Microscopy and Microanalysis 1996. Minneapolis, MN (USA), August 11-15, 1996, 1996. 1000 - 1001.