Interface related strength phenomena in two-phase titanium aluminides

Confpaper

No abstract available.

URL: https://publications.hereon.de/id/18824/
Authors:Christoph, U., Oehring, M., Appel, F.
Year:2000
In: Interfacial Engineering for Optimized Properties II, Symposium
Volume:586
Location:Boston, MA (USA)
Date:01.-02.12.1999
Pages:175 - 180
Type:Confpaper
ISBN: 1-55899-494-7
Cite as: Christoph, U.; Oehring, M.; Appel, F.: Interface related strength phenomena in two-phase titanium aluminides. In: Carter, C.B.; Hall, E.L.; Nutt, S.R.; Briant, C.L. (Eds.): Interfacial Engineering for Optimized Properties II, Symposium. Vol. 586 Boston, MA (USA), 01.-02.12.1999, 2000. 175 - 180. (ISBN: 1-55899-494-7)