Trace element analysis using Total Reflection X-ray Flourescence Spectrometry
No abstract available.
URL: https://publications.hereon.de/id/22133/
Authors:Prange, A., Schwenke, H.
Year:1992
In: First Pacific-International Congress on X-Ray Analytical Methods (PICXAM) and Fortieth Annual Conference on Applications of X-Ray Analysis
Location:Hilo and Honolulu, HI (USA)
Date:07.-16.08.1991
Cite as: Prange, A.; Schwenke, H.: Trace element analysis using Total Reflection X-ray Flourescence Spectrometry. In: First Pacific-International Congress on X-Ray Analytical Methods (PICXAM) and Fortieth Annual Conference on Applications of X-Ray Analysis. Hilo and Honolulu, HI (USA), 07.-16.08.1991, 1992.
