Image metrics for the automated alignment of microtomography data
No abstract available.
URL: https://publications.hereon.de/id/24883/
Authors:Donath, T., Beckmann, F., Schreyer, A.
Year:2006
In: X-ray, Gamma Ray, and Particle Technologies, Developments in X Ray Tomography V, Optics and Photonics, SPIE 2006
Volume:6318
Location:San Diego, CA (USA)
Date:15.-17.08.2006
Pages:631818
Type:Confpaper
ISBN: 0-8194-6439-2
Cite as: Donath, T.; Beckmann, F.; Schreyer, A.: Image metrics for the automated alignment of microtomography data. In: X-ray, Gamma Ray, and Particle Technologies, Developments in X Ray Tomography V, Optics and Photonics, SPIE 2006. Vol. 6318 San Diego, CA (USA), 15.-17.08.2006, 2006. 631818. (ISBN: 0-8194-6439-2)
