In-situ analysis of crystallographic textures using high-energy X-rays
Abstract
Hard X-rays with energies higher than 50 keV are characterized by there high penetration length in most materials. In the case of 100 keV to 200 keV X-rays the penetration length is in the same order as for thermal neutrons.
URL: https://publications.hereon.de/id/26407/
Authors:Brokmeier, H.-G., Yi, S., Homeyer, J.
Year:2008
In: Archives of Metallurgy and Materials
Volume:53
Pages:33 - 38
Publisher:Instytut Metalurgii i In·Zynierii Materialowej, Warszawa
Type:Journalpaper
ISSN: 1733-3490
Cite as: Brokmeier, H.-G.; Yi, S.; Homeyer, J.: In-situ analysis of crystallographic textures using high-energy X-rays. In: Archives of Metallurgy and Materials. Vol. 53 (2008) 33 - 38.
