Authors:Marschall, F., Last, A., Simon, M., Kluge, M., Nazmov, V., Vogt, H., Ogurreck, M., Greving, I., Mohr, J.
Year:2013
In: 22nd International Congress on X-Ray Optics and Microanalysis, ICXOM 2013
Location:Hamburg (D)
Date:02.-06.09.2013
Cite as: Marschall, F.; Last, A.; Simon, M.; Kluge, M.; Nazmov, V.; Vogt, H.; Ogurreck, M.; Greving, I.; Mohr, J.: X-ray Full Field Microscopy at 30 keV. In: 22nd International Congress on X-Ray Optics and Microanalysis, ICXOM 2013. Hamburg (D), 02.-06.09.2013, 2013.
